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Softer Memory Market Impacts Probe Card Manufacturers
VLSI Research Inc. (Santa Clara, Calif.) reports that weakness in the semiconductor industry pushed down sales growth of probe cards used for testing IC wafers to 13.9% in 2007.

Dow Corning opens solar module, assembly app center
To collaborate with customers in the development, evaluation and pilot material solutions used to manufacture solar panels, Freeland, Mich.–based Dow Corning Corp has opened a solar solutions application center at its headquarters.

University working to create nanostructures to raise thin-film solar cell efficiency
Researchers at the University of California, San Diego led by Professor Edward Yu are working to create thin-film “single junction” solar cells with 45% sunlight-to-electricity conversion efficiencies by using nanostructures that scatter and channel light, electrical engineers.

OLPC XO laptops add Windows OS
Despite its original goal to offer the world's poorest children a $100 laptop that ran free, open-source, tinkerable software, One Laptop per Child is adding the Microsoft Windows operating system to its XO laptops. The easily recognizable green laptops will also continue to host Linux.

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News from the Web

The potentially big business of tiny displays
Turmoil at Infineon, NXP, ST, Qimonda tops story ranking
Source: www.eetimes.eu
Date: 14 hours 39 minutes ago
Strong growth for thick-SOI substrates by 2012, says Yole
KLA-Tencor's New Singapore Facility Will Provide Base for Regional Expansion (Business Wire)
Source: biz.yahoo.com
Date: 22 hours 57 minutes ago

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Wafer Processing Splinter Sees Weak Order Period Looming for Equipment Vendors Applied Tackles Edge With Inflexion Polishing System Physical Analysis Provides Images of 45 nm View All Stories	Lithography Maskless E-Beam Delivers 65 nm Prototypes Haze, Still Misunderstood, Costing Industry $1B a Year Litho Guru Optimistic About Nanoimprint View All Stories
Yield Management How to Detect Non-Overlay Misalignment Errors? A Better Way to Manage Test Wafers Applied Tackles Edge With Inflexion Polishing System View All Stories	Inspection, Measurement & Test Splinter Sees Weak Order Period Looming for Equipment Vendors New Probe Preps AFM for Inline Metrology How to Detect Non-Overlay Misalignment Errors? View All Stories
Clean Processing Haze, Still Misunderstood, Costing Industry $1B a Year Applied Tackles Edge With Inflexion Polishing System SEZ Group Now Lam’s Spin Clean Division View All Stories	Materials Artificial Superlattices Promise Better Memories Freescale Taking Redistributed Chip Packaging to Pilot Production Stage Light/Matter Interaction to Improve Semiconductor Interfaces View All Stories

News from Lexis Nexis

KLA-Tencor's Singapore Base Aimed at Regional Expansion

IBM Uses Lenses to Enhance Power of Sun

Rudolph Announces New Wafer Scanner for 3-D Bump Metrology

Blogs
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The Measure of All Things
Alexander E. Braun, Senior Editor, Semiconductor International
May 13, 2008
A Modest Proposal
For decades now, there has been a desperate wringing of hands and loud, roaring noise...
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Views on News
David Lammers, News Editor, Semiconductor International
May 15, 2008
Y.W. Lee and Samsung's Rise
Yoon-Woo Lee, named Wednesday (May 14) to the CEO position at Samsung Electronics Co....
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The Fine Print
Aaron Hand, Executive Editor, Semiconductor International
May 14, 2008
High-Index Immersion Lands With a Thud
At Sematech’s Litho Forum this week in Bolton Landing, N.Y., the proponents of ...
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Perspectives From the Leading Edge
Philip Garrou, Consultant,
May 10, 2008
SMTA 3D Meeting in Research Triangle PArk
It must be nice for those of you living in the Bay area where conferences on every mi...
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what quality lattices are they. If it has single defect is it contained or does it af...
Neil Farbstein - 5/15/2008 12:16:45 PM PT
in response to Artificial Superlattices Promise Better Memories

"This is the first full-scale application of EBDW techniques for complex logic chips,...
WaferMaker - 5/12/2008 2:27:16 PM PT
in response to Maskless E-Beam Delivers 65 nm Prototypes

Actually, it is Sanders....
Terri S - 5/11/2008 9:10:50 PM PT
in response to Real Men/Women Do Have Fabs

Effective resolution down to 24 nm? Clarification?...
huh - 5/10/2008 7:19:52 AM PT
in response to Sematech Researchers to Report Progress at EUVL Symposium

» VIEW ALL TALKBACK THREADS

Meeting Nanotech's Metrology Challenges

Dan Herr is director of Nanomanufacturing Science Research at SRC. An important part of his research focuses on nanotechnology’s demands on metrology, and he discusses his work to determine where metrology technology’s gaps are, and how to fill them.